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PID Check 便攜式現(xiàn)場(chǎng)PID測(cè)試儀
- 公司名稱 束蘊(yùn)儀器（上海）有限公司
- 品牌 Freiberg Instruments
- 型號(hào) PID Check
- 產(chǎn)地 德國(guó)
- 廠商性質(zhì) 代理商
- 更新時(shí)間 2024/9/12 8:56:56
- 訪問(wèn)次數(shù) 707
電池片Pid測(cè)試儀電位誘導(dǎo)衰減（PID）Topcon電池Pid測(cè)試儀雙面電池Pid測(cè)試光伏電池Pid
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MicroCT，顯微CT，微焦點(diǎn)CT，骨骼成像，顯微CT材料學(xué)檢測(cè)，微納顯微CT,X射線斷層掃描，TOC,元素檢測(cè)
| 價(jià)格區(qū)間 | 面議 | 應(yīng)用領(lǐng)域 | 醫(yī)療衛(wèi)生,環(huán)保,食品,化工,能源 |
|---|
便攜式現(xiàn)場(chǎng)PID測(cè)試儀的好處和特點(diǎn)
安裝后或采購(gòu)光伏電站前的質(zhì)量檢查
PIDcheck是能夠發(fā)現(xiàn)已安裝的光伏組件是否對(duì)PID敏感的工具。
功率和產(chǎn)量預(yù)測(cè)
如果PID已經(jīng)發(fā)生，只有PIDcheck的測(cè)量結(jié)果可以提供未來(lái)產(chǎn)量的預(yù)測(cè)。
評(píng)估針對(duì)PID的對(duì)策
PIDcheck設(shè)備能夠模擬恢復(fù)設(shè)備（偏移箱、浮動(dòng)控制器）的應(yīng)用，因此有助于在其安裝前評(píng)估恢復(fù)效果。
用于現(xiàn)場(chǎng)PID恢復(fù)的可逆高壓極性
便攜式現(xiàn)場(chǎng)PID測(cè)試儀可測(cè)量的參數(shù)
分流電阻、功率損耗、電導(dǎo)率、泄漏電流、濕度和溫度
易于使用的便攜式設(shè)備
欲了解更多信息，請(qǐng)?jiān)L問(wèn)www.pidcon。。ｃｏｍ
● 原型：24個(gè)電池，在高壓下正向暗I-V曲線的測(cè)量
● 新功能：高壓可雙向施加應(yīng)力和恢復(fù) 在活動(dòng)模塊中成功演示
● Fraunhofer CSP 于2015年*提交認(rèn)證
● 2018年上市
● 用戶：評(píng)估員、操作員、服務(wù)專家、安裝人員、模塊制作人
* Patent pending ?Verfahren und Anordnung zur Prüfung eines Solarmoduls auf Anf?lligkeit für Potentialinduzierte Degradation”, DE 10 2015 213 047 A1
參考文獻(xiàn)： cells (1)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Local corrosion of silicon as root cause for potential induced degradation at the rear side of bifacial PERC solar cells. physica status solidi (RRL)–Rapid Research Letters. 2019, doi 10.1002/pssr.201900163
(2)V. Naumann, K. Ilse, M. Pander, J. Tr?ndle, K. Sporleder, C. Hagendorf, Influence of soiling and moisture ingress on long term PID susceptibility of photovoltaic
modules, AIP Conference Proceedings 2147, 090005 (2019).
(3)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Root cause analysis on corrosive potential-induced degradation effects at the rear side of bifacial silicon PERC solar cells, Solar Energy Materials and Solar Cells 201, 110062 (2019).
(4)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. H?hnel, S. Gro?er, M. Turek, C. Hagendorf, Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells
as Root Cause of Potential‐Induced Degradation at the Rear Side, Phys. Status Solidi A (2019), doi:10.1002/pssa.201900334.
(5)K. Sporleder, J. Bauer, S. Gro?er, S. Richter, A. H?hnel, M. Turek, V. Naumann, K. Ilse, C. Hagendorf, Potential-Induced Degradation of Bifacial PERC Solar Cells Under Illumination, IEEE Journal of Photovoltaics 9 (6) 1522-1525, 2019.
(6)K. Sporleder, M. Turek, N. Schüler, V. Naumann, D. Hevisov, C. P?blau, S. Gro?er, H. Schulte-Huxel, J. Bauer, C. Hagendorf, Quick test for reversible and irreversible PID of bifacial PERC solar cells, Solar Energy Materials and Solar Cells 219, 110755, 2021.
(7)K. Sporleder, V. Naumann, J. Bauer, D. Hevisov, M. Turek, and C. Hagendorf, Time-resolved Investigation of Transient Field Effect Passivation States during Potential Induced Degradation and Recovery of Bifacial Silicon Solar Cells , Solar RRL, 2021, accepted.
. Hagendorf, Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cellsas Root Cause of Potential‐Induced Degradation at the Rear Side, Phys. Status Solidi A (2019), doi:10.1002/pssa.201900334.
(5)K. Sporleder, J. Bauer, S. Gro?er, S. Richter, A. H?hnel, M. Turek, V. Naumann, K. Ilse, C. Hagendorf, Potential-Induced Degradation of Bifacial PERC Solar Cells Under Illumination, IEEE Journal of Photovoltaics 9 (6) 1522-1525, 2019.
(6)K. Sporleder, M. Turek, N. Schüler, V. Naumann, D. Hevisov, C. P?blau, S. Gro?er, H. Schulte-Huxel, J. Bauer, C. Hagendorf, Quick test for reversible and irreversible PID of bifacial PERC solar cells, Solar Energy Materials and Solar Cells 219, 110755, 2021.
(7)K. Sporleder, V. Naumann, J. Bauer, D. Hevisov, M. Turek, and C. Hagendorf, Time-resolved Investigation of Transient Field Effect Passivation States during Potential Induced Degradation and Recovery of Bifacial Silicon Solar Cells , Solar RRL, 2021, accepted.
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