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干濕兩用激光粒度儀參數(shù)

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  • 公司名稱 珠海真理光學(xué)儀器有限公司
  • 品牌 linkoptik/真理光學(xué)
  • 型號(hào)
  • 產(chǎn)地 珠海
  • 廠商性質(zhì) 生產(chǎn)廠家
  • 更新時(shí)間 2020/3/17 15:37:49
  • 訪問(wèn)次數(shù) 3389
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干濕兩用激光粒度儀

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真理光學(xué)儀器有限公司專注于Gao端顆粒表征儀器的研發(fā)和制造,產(chǎn)品涵蓋激光(衍射法)粒度分析儀、動(dòng)態(tài)光散射納米粒度及Zeta電位分析儀以及顆粒圖像分析儀,既有實(shí)驗(yàn)室儀器,又有在線檢測(cè)系統(tǒng)。真理光學(xué)秉持“科學(xué)態(tài)度,工匠精神”,為用戶提供世界Xian進(jìn)的Gao端產(chǎn)品和服務(wù)。

真理光學(xué)匯集了以張福根博士為代表的全國(guó)顆粒表征領(lǐng)域的頂尖人才。張福根博士現(xiàn)任本公司董事長(zhǎng)兼首Xi科學(xué)家,還擔(dān)任全國(guó)顆粒表征及分檢與篩網(wǎng)標(biāo)準(zhǔn)化技術(shù)委員會(huì)副主任委員、天津大學(xué)兼職教授,曾擔(dān)任中國(guó)顆粒學(xué)會(huì)副理事長(zhǎng),同時(shí)也是“歐美克”字號(hào)公司的創(chuàng)始人。曾擔(dān)任英國(guó)某粒度儀器公司中國(guó)總經(jīng)理20余年的秦和義先生擔(dān)任本公司商務(wù)總經(jīng)理,中國(guó)顆粒學(xué)會(huì)青年理事潘林超博士、陳進(jìn)博士擔(dān)綱公司的研發(fā)主力。

激光(衍射法)粒度儀雖然已得到廣泛應(yīng)用,但它并不Wan美,不論是科學(xué)基礎(chǔ)方面,還是技術(shù)方案方面。真理光學(xué)的團(tuán)隊(duì)針對(duì)當(dāng)前市面上儀器存在的不足,展開(kāi)了系統(tǒng)的理論研究和技術(shù)創(chuàng)新,發(fā)現(xiàn)了衍射光斑(愛(ài)里斑)的反常變化現(xiàn)象(ACAD),解釋了為什么不能測(cè)量3μm左右的聚苯乙烯微球,并給出了反常區(qū)(不能測(cè)量粒徑)的一般公式;研究了衍射儀器的測(cè)量上限和下限;研究了顆粒折射率偏差對(duì)測(cè)量結(jié)果的影響,發(fā)明了兩種根據(jù)散射光分布估算顆粒折射率的方法;提出了斜置梯形窗口技術(shù)方案(Zhuan利),解決了前向超大角測(cè)量盲區(qū)的問(wèn)題,使衍射儀器的亞微米顆粒測(cè)量水平顯著提高;提出了統(tǒng)一的反演算法(專有技術(shù)),消除了不同計(jì)算模式給出不同結(jié)果的尷尬;設(shè)計(jì)出了高達(dá)20Kfps的超高速并行數(shù)據(jù)采樣電路,使干法測(cè)量的精度不亞于濕法測(cè)量,對(duì)高速噴霧場(chǎng)的測(cè)量(時(shí)間)分辨率也更高。

在納米粒度及Zeta電位儀方面,真理光學(xué)提出了比相位分析法(PALS)更先進(jìn)的余弦擬合相位分析法(CF-PALS),用光纖分束取代了傳統(tǒng)的平板分束鏡分束,用光纖內(nèi)光干涉取代了自由空間干涉,使Zeta電位的測(cè)量重復(fù)性大幅度提高。

Linkoptik Instruments specializes in the development and manufacture of high-end particle characterization instruments, including laser (diffraction) particle size analyzers, dynamic light scattering nano particle size and zeta potential analyzers, and particle image analyzers, both laboratory instruments and online inspection systems. Linkoptik Instruments upholds the "scientific attitude and craftsmanship" to provide customers with the world's advanced high-end products and services.

Linkoptik Instruments has gathered the top talents in the field of particle characterization in China, represented by Dr. Fugen Zhang. Dr. Zhang is the Chairman and Chief Scientist of our company, and is also the Vice Chairman of the National Technical Committee for Particle Characterization and Sieving and Sieve Standardization, a part-time professor of Tianjin University, and the Vice Chairman of the Chinese Particle Society. Mr. Qin He Yi, who was the general manager of a particle size instrument company in China for more than 20 years, is the commercial general manager of the company, and Dr. Pan Linchao and Dr. Chen Jin, the young directors of the Chinese Particle Society, are the main R&D team of the company.

Although laser (diffraction) particle size measurement has been widely used, it is not perfect, both in terms of scientific basis and technical solutions. The team at Truth Optics has conducted systematic theoretical research and technological innovation to address the shortcomings of the current instruments on the market, discovered the phenomenon of anomalous variation of diffraction spot (Airy spot) (ACAD), explained why polystyrene microspheres around 3 μm cannot be measured, and gave a general formula for the anomalous zone (not measuring particle size); studied the upper and lower measurement limits of diffraction instruments; studied the effect of particle The influence of refractive index deviation on the measurement results was studied, and two methods for estimating the refractive index of particles based on the scattered light distribution were invented; an oblique trapezoidal window technical solution (patented) was proposed, which solved the problem of the blind area of the forward oversized angle measurement and significantly improved the submicron particle measurement level of the diffraction instrument; a unified inversion algorithm (proprietary technology) was proposed, which eliminated the embarrassment of different calculation modes giving different results; the design of The ultra-high speed parallel data sampling circuit of up to 20Kfps has been designed, which makes the accuracy of dry measurement no less than that of wet measurement, and the measurement (time) resolution of high-speed spray field is also higher.

In nanometer particle size and zeta potential measurement, Linkoptik Instruments has proposed a more advanced cosine fitted phase analysis method (CF-PALS) than PALS, replacing the traditional flat beam splitter mirror beam splitting with fiber optic beam splitting, and replacing free space interference with optical interference inside the fiber, which has greatly improved the repeatability of zeta potential measurement.




專注于顆粒(包含粉體顆粒、乳膠顆粒和液體霧滴)測(cè)試技術(shù)的研發(fā)和儀器的生產(chǎn)銷售

產(chǎn)地類別 國(guó)產(chǎn) 儀器種類 靜態(tài)光散射

  干濕兩用激光粒度儀是一種性能優(yōu)良的粒度分布儀,干法分散系統(tǒng)采用文丘里分散效應(yīng),通過(guò)剪切、慣性、碰撞等方法粉體在通過(guò)測(cè)量窗口時(shí)處于充分分散狀態(tài),即使對(duì)難以分散的樣品如釹鐵硼粉,也能得到充分分散,得到的測(cè)量結(jié)果。干濕兩用激光粒度儀采用專門(mén)設(shè)計(jì)的由大規(guī)模集成電路工藝制造的大尺寸高靈敏度光電探測(cè)器陣列,分辨率高,性好;采用全程米氏理論和多種分布模型的數(shù)據(jù)處理方式;采用高精度的數(shù)據(jù)傳輸與處理電路等一系列的技術(shù)和制造工藝,使該儀器具有可靠、測(cè)試速度快、重復(fù)性好、操作簡(jiǎn)便等突出特點(diǎn),是集激光技術(shù)、計(jì)算機(jī)技術(shù)、光電子技術(shù)于一體的新一代干法粒度測(cè)試儀器。


  干濕兩用激光粒度儀主要原理:激光粒度儀作為一種新型的粒度測(cè)試儀器,已經(jīng)在粉體加工、應(yīng)用與研究領(lǐng)域得到廣泛的應(yīng)用。它的特點(diǎn)是測(cè)試速度快、測(cè)試范圍寬、重復(fù)性和真實(shí)性好、操作簡(jiǎn)便等等。


  1、激光法的粒度測(cè)試原理:


  激光粒度儀是根據(jù)顆粒能使激光產(chǎn)生散射這一物理現(xiàn)象測(cè)試粒度分布的。由于激光具有很好的單色性和*的方向性,所以一束平行的激光在沒(méi)有阻礙的無(wú)限空間中將會(huì)照射到無(wú)限遠(yuǎn)的地方,并且在傳播過(guò)程中很少有發(fā)散的現(xiàn)象。


  當(dāng)光束遇到顆粒阻擋時(shí),一部分光將發(fā)生散射現(xiàn)象,散射光的傳播方向?qū)⑴c主光束的傳播方向形成一個(gè)夾角θ。散射理論和實(shí)驗(yàn)結(jié)果都告訴我們,散射角θ的大小與顆粒的大小有關(guān),顆粒越大,產(chǎn)生的散射光的θ角就越小;顆粒越小,產(chǎn)生的散射光的θ角就越大。在圖8中,散射光I1是由較大顆粒引起的;散射光I2是由較小顆粒引起的。進(jìn)一步研究表明,散射光的強(qiáng)度代表該粒徑顆粒的數(shù)量。這樣,在不同的角度上測(cè)量散射光的強(qiáng)度,就可以得到樣品的粒度分布了。

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