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Manufacturer:HP

Refurbished by:Allwin21 Corp

HP4145B Semiconductor Parameter Analyzer 

Designed for production-linelaboratory use, the HP4145B is the electronics industry''s first standalone instrument capable of complete dc characterization of semiconductor devicesmaterials. It stimulates voltage-and current-sensitive devices, measures the resulting currentvoltage responses,displays the results in a user-selectable format （graph, list, matrix, or schmoo） on a built-in CRT display. An on-board programmable calculator provides real-time calculation of voltage/current-dependent parameters, such as the current gain （HFE）transconductance（gm） of transistors, which can also be displayed on the CRT. A number of powerful graphic analysis tools--marker, cursor, line function,interpolation--enhance the HP 4145B''s basic capabilitiesprovide fast, accurate analysis of semiconductor devices, leading to increased production yieldsimproved device quality.

Four built-in source monitor units （SMUs） are the heart of the HP 4145B. Each SMU can be independently programmed to function as either a voltage source/current monitor or a current source/voltage monitor. Thus a bipolar transistor, for example, can be compley characterized in common-base, common-emitter,common-collector configurations without changing connectionsoonly changing the SMU’s operating modes is required. The HP 4145B is also equipped with 2 voltage sources2 voltage monitors for measurements on devices having more than 4 terminals, such as ICs. The HP4145B can be controlled from the front panel via the HP-IB （standard）, or by measurement setups stored on diskettes.

Displayed information--measurement setups, auto-sequence programs,measurement results can be dumped directly onto an external graphics plotter to obtain publication quality hard copies. A built-in 3”inch disk drive enables you to store measurement setupsmeasured data, which can be accessed by another compatible HP disk drive for further processing. 

HP4145B Parameter Analyzer key features:

• Fully automatic, high-peed dc characterization of semiconductor devices
• High-resolution, wide-range sourcingmeasurement

 I: 50 fA to 100 mA; V: 1 mV to 100 V

• Maximum 1140 measurementdisplay points for precise measurementanalysis
• Flexible graphic analysis functions for quick parameter extraction
• Built-in 3-inch disk drive for storage of 240 user programs or 105 measurement results